A Low Power Test Data Compression Scheme for Scan Test
نویسندگان
چکیده
In this paper, an uncertain state filling method is proposed, which can not only effectively reduce the scan shifting power consumption, but also test time simultaneously for test. This based on threshold algorithm of filling, both weighted transitions metric (WTM) and improve compression efficiency vectors. Experiments with ISCAS’89 benchmark circuits show that proposed make a good tradeoff between consumption efficiency.
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ژورنال
عنوان ژورنال: Frontiers in artificial intelligence and applications
سال: 2022
ISSN: ['1879-8314', '0922-6389']
DOI: https://doi.org/10.3233/faia220518